Semiconductor Wafer Analyzer

Wafercheck 150

Specifications

System
Mode of operation		Time-Correlated Single Photon Counting (TCSPC)

Excitation Sources
Light source		Laser Diode Heads (LDH)
Wavelengths1		375 - 510 nm, 530 nm, 595 nm, 635 - 810 nm
Pulse width		50 ps - 500 ps
Repetition rate		up to 40 MHz (80 MHz optional)

Detectors
Type2		PMT		MCP-PMT
Spectral range		185 - 900 nm		160 - 850 nm

Data Acquisition
Type		NanoHarp 250		PicoHarp 300
Time resolution (bin width)		4 ns or 32 ns		4 ps
Lifetime resolution		< 10 ns		< 30 ps
Number of time channels/curve		up to 262144		65536
Discriminator level, zero cross adjust		software adjustable
Collection time		1 ms to 1 h

Data Analysis Software
Type		FluoFit (Basic or Professional version)
Analysis possibilities		exponential decay, lifetime distribution, anisotropy, global analysis for all methods

Operation Environment
Operating system		Windows® 2000/XP/Vista/7
Power requirements		110 to 230 V, 50/60 Hz
Dimensions		300 mm × 375 mm × 150 mm (w × d × h)
1other wavelengths available upon request 2other detector types and cooling available upon request

All Information given here is reliable to our best knowledge. However, no responsibility is assumed for possible inaccuracies or omissions. Specifications and external appearances are subject to change without notice.
© PicoQuant GmbH, 1998 - 2012